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  1. L. R. Baker, T. Moss, in Proceedings, Electro-Optical Systems Design Conference (Industrial & Conference Management, Chicago, 1969).
  2. I. Putora, J. Soc. Motion Pict. Telev. Eng. 78, 956 (1969).
  3. H. Molitz, Photogr. Korresp. 95, 3, 19 (1959).
  4. H. Frieser, Photographic Information Recording (Focal Press, London, 1975), p. 537.
  5. This work was supported in part by a grant from Bell Laboratories.

1969 (1)

I. Putora, J. Soc. Motion Pict. Telev. Eng. 78, 956 (1969).

1959 (1)

H. Molitz, Photogr. Korresp. 95, 3, 19 (1959).

Baker, L. R.

L. R. Baker, T. Moss, in Proceedings, Electro-Optical Systems Design Conference (Industrial & Conference Management, Chicago, 1969).

Frieser, H.

H. Frieser, Photographic Information Recording (Focal Press, London, 1975), p. 537.

Molitz, H.

H. Molitz, Photogr. Korresp. 95, 3, 19 (1959).

Moss, T.

L. R. Baker, T. Moss, in Proceedings, Electro-Optical Systems Design Conference (Industrial & Conference Management, Chicago, 1969).

Putora, I.

I. Putora, J. Soc. Motion Pict. Telev. Eng. 78, 956 (1969).

J. Soc. Motion Pict. Telev. Eng. (1)

I. Putora, J. Soc. Motion Pict. Telev. Eng. 78, 956 (1969).

Photogr. Korresp. (1)

H. Molitz, Photogr. Korresp. 95, 3, 19 (1959).

Other (3)

H. Frieser, Photographic Information Recording (Focal Press, London, 1975), p. 537.

This work was supported in part by a grant from Bell Laboratories.

L. R. Baker, T. Moss, in Proceedings, Electro-Optical Systems Design Conference (Industrial & Conference Management, Chicago, 1969).

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Figures (5)

Fig. 1
Fig. 1

Two new charts for the measurement of lens resolution: (a) vernier resolution; (b) triangular wave pattern.

Fig. 2
Fig. 2

High-contrast photographs showing (A) sharp imagery and (B), (C), and (D) successive stages of defocus of the vernier resolution chart. Note that vernier correspondence occurs at line pairs marked 0 in frame (A) 3 in frame (B), 8 in frame (C), and 10 in frame (D).

Fig. 3
Fig. 3

Reflectance cross sections of (A) sharp and (B), (C) unsharp images of lines forming the Vernier resolution chart.

Fig. 4
Fig. 4

High-contrast renditions of the triangular wave patterns photographed at a distance using (a) a high-quality lens and (b) an inferior lens.

Fig. 5
Fig. 5

Two-dimensional pattern of reflectance for new form of MTF measurement chart. High-contrast photographs of an ensemble of such patterns of increasing spatial frequency render an exact plot of the MTF function.

Equations (1)

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R = 1 4 sin ( w x ) + 1 2 y + 1 4

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