Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Faraday Rotation of a System of Thin Layers Containing a Thick Layer

Not Accessible

Your library or personal account may give you access

Abstract

An expression for the Faraday rotation produced by a system of thin layers containing a single thick layer is derived for the situation in which the thin layers exhibit fully developed interference fringes, and the fringes caused by the thick layer are completely suppressed. All layers are assumed to be homogeneous and isotropic. The suppression of the fringes produced by the thick layer is assumed to arise from the presence of a frequency distribution in the incident radiation. Restrictions are imposed in order that the result should not depend on the exact details of the frequency distribution.

© 1971 Optical Society of America

Full Article  |  PDF Article
More Like This
Absolute Reflectances from Reflectometer Readings

W. F. Sullivan
Appl. Opt. 10(7) 1550-1558 (1971)

Faraday Rotation in FeNi Films

H. H. Wieder and D. A. Collins
Appl. Opt. 2(4) 411-420 (1963)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (37)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved