Abstract

Two-wavelength interferometry that is based on a Fourier-transform method has been investigated. A phase profile at a synthetic wavelength has been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between modulation intensities at two wavelengths has been theoretically and numerically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram.

© 1998 Optical Society of America

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