Abstract

Understanding of the carrier concentration properties of current spreading layers in LED devices is important although difficult to achieve. Here, we present a solution to determine the carrier concentration for current spreading layers in ZnO-based LEDs, based on Raman spectroscopy. Raman spectra and lineshape fitting indicate a hole concentration below $1\times {10}^{18}{\mathrm{cm}}^{-3}$ in the $p$-type region and an electron concentration of $1.21\times {10}^{19}{\mathrm{cm}}^{-3}$ in $n$-type. The results from Raman spectroscopy are further qualitatively confirmed by the electroluminescence spectrum and device simulation, which demonstrates its possible application in carrier concentration assessment in multilayered structures.

© 2019 Optical Society of America

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