Abstract

The negative Goos–Hänchen shift (GHS) on a two-dimensional photonic crystal with an effective negative refractive index is investigated by simulation and experiment. The measured refractive index of the fabricated photonic crystal is nearly $-0.44$. The difference between the Goos–Hänchen shift of the transverse electric wave $G_{\mathrm{TE}}$ and that of the transverse magnetic wave $G_{\mathrm{TM}}$ (DGHS) in the height direction of a silicon rod is measured at three incident angles. The result shows that DGHS is always smaller than $-G_{\mathrm{TM}}$, thus $G_{\mathrm{TE}}<0$; therefore, the negative GHS does occur on the surface of the photonic crystal with a negative refractive index.

© 2017 Optical Society of America

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