Abstract
Several optical methods including ultraviolet absorption, infrared absorption of the hydroxyl ions, Raman spectroscopy, and the Z-scan method have been used to determine the damage resistance threshold in 0–0.72 mol. % Zr-containing, flux-grown, nearly stoichiometric single crystals. All spectroscopical methods used indicate that samples containing at least Zr in the crystal are above the threshold while Z-scan data locate the photorefractive damage threshold between 0.085 and 0.314 mol. % Zr.
© 2013 Optical Society of America
Full Article | PDF ArticleMore Like This
László Kovács, Laura Kocsor, Éva Tichy-Rács, Krisztián Lengyel, László Bencs, and Gábor Corradi
Opt. Mater. Express 9(12) 4506-4516 (2019)
Yasunori Furukawa, Kenji Kitamura, Shunji Takekawa, Kazuo Niwa, and Hideki Hatano
Opt. Lett. 23(24) 1892-1894 (1998)
T. R. Volk, V. I. Pryalkin, and N. M. Rubinina
Opt. Lett. 15(18) 996-998 (1990)