Abstract
An interference filter based on Nb2O5 and SiO2 is designed for coarse-wavelength multiplexing devices. Studies are carried out concerning how errors in sputtering the layers affect the spectral response of the filter. The layers that are most sensitive to errors and the allowable error of sputtering the coating are determined. The possibility of correcting the allowed errors during the deposition of the interference layers of the filter is evaluated. The sputtering errors are analyzed for a sample filter obtained experimentally. © 2004 Optical Society of America
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription