Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Journal of the Optical Society of Korea
  • Vol. 4,
  • Issue 2,
  • pp. 89-93
  • (2000)

Absolute Temperature Measurement using White Light Interferometry

Open Access Open Access

Abstract

Recently a new signal processing algorithm for white light interferometry was presented. In this paper, the proposed signal processing algorithm was applied for absolute temperature measurement using white light interferometry. Stability testing and absolute temperature measurement were demonstrated. Stability test demonstrated the feasibility of absolute temperature measurement with an accuracy of 0.015 fringe. The test also showed that the absolute temperature measurement system using white light interferometry is capable of obtaining the theoretical minimum detectable change (0.0005 fringe), which is consistent with the performance predicted by the proposed signal processing algorithm.

© 2000 Optical Society of Korea

PDF Article
More Like This
Polarizing white light interferometry for phase measurements using two simultaneous interferograms

Jose-Rubén Sánchez-Aguilar, Ana Karen Reyes, Luis García-Lechuga, Areli Montes-Perez, and Noel-Ivan Toto-Arellano
Appl. Opt. 62(27) 7280-7287 (2023)

Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry

Seung Hwan Kim, Seoung Hun Lee, Jae In Lim, and Kyong Hon Kim
Appl. Opt. 49(5) 910-914 (2010)

Cited By

Optica participates in Crossref's Cited-By Linking service. Citing articles from Optica Publishing Group journals and other participating publishers are listed here.


Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved