Abstract

A form of optical second-harmonic microscopy has been developed that spatially resolves concentration gradients of surface adsorbates. Surface concentration profiles at submonolayer levels are illuminated with a pulsed laser, and the reflected second-harmonic light is imaged into a photodiode array. Micrometer-scale resolution is obtainable while the surface damage and the spurious chemistry induced by more conventional electron- or ion-based techniques are avoided. We have used this microscopy to monitor the surface diffusion of Sb on Ge(111).

© 1993 Optical Society of America

Optical second-harmonic generation from adsorbate layers in total-reflection geometry

B. U. Felderhof, A. Bratz, G. Marowsky, O. Roders, and F. Sieverdes
J. Opt. Soc. Am. B 10(10) 1824-1833 (1993)

Interference between second-harmonic generation from a substrate and from an adsorbate layer

G. Berkovic, Y. R. Shen, G. Marowsky, and R. Steinhoff
J. Opt. Soc. Am. B 6(2) 205-208 (1989)

Experiments on optical second-harmonic generation as a surface probe of electrodes

G. L. Richmond, H. M. Rojhantalab, J. M. Robinson, and V. L. Shannon
J. Opt. Soc. Am. B 4(2) 228-236 (1987)

Angular dependence of optical second-harmonic generation at a Ge(111) surface

R. W. J. Hollering
J. Opt. Soc. Am. B 8(2) 374-377 (1991)

Inhomogeneous deformation of silicon surface layers probed by second-harmonic generation in reflection

S. V. Govorkov, V. I. Emel’yanov, N. I. Koroteev, G. I. Petrov, I. L. Shumay, and V. V. Yakovlev
J. Opt. Soc. Am. B 6(6) 1117-1124 (1989)