Abstract

The results of a preceding paper [ J. Opt. Soc. Am. 65, 1464, ( 1975)] are viewed from a different angle as providing the basis for the design of film–substrate single-reflection linear partial polarizers (LPP), which also operate as reflection optical rotators. The important characteristics of a comprehensive set of discrete designs of SiO₂-Si LPP’s at λ = 6328 Å are shown graphically.

© 1975 Optical Society of America

Design of film–substrate single-reflection retarders*

A.-R. M. Zaghloul, R. M. A. Azzam, and N. M. Bashara
J. Opt. Soc. Am. 65(9) 1043-1049 (1975)

Polarizer–surface-analyzer null ellipsometry for film–substrate systems*

R. M. A. Azzam, A.-R. M. Zaghloul, and N. M. Bashara
J. Opt. Soc. Am. 65(12) 1464-1471 (1975)

Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*

R. M. A. Azzam, A.-R. M. Zaghloul, and N. M. Bashara
J. Opt. Soc. Am. 65(3) 252-260 (1975)

Single-reflection film–substrate half-wave retarders with nearly stationary reflection properties over a wide range of incidence angles

R. M. A. Azzam and M. Emdadur Rahman Khan
J. Opt. Soc. Am. 73(2) 160-166 (1983)

Photometric ellipsometer for measuring partially polarized light

D. E. Aspnes
J. Opt. Soc. Am. 65(11) 1274-1278 (1975)