Abstract

Low-loss planar and channel waveguides in ${\rm Pr}^{3+}$ -doped yttrium orthosilicate single crystals were fabricated using 6-MeV oxygen ion implantation. The fabricated surface guiding structure was characterized by the prism coupling method. The relationship between the implantation induced index change and the implantation fluence has been investigated. The photoluminescence properties of the implanted samples were found to be well preserved with respect to the bulk, exhibiting possible applications for integrated quantum memory and laser generation devices.

© 2015 IEEE

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