We demonstrate the integration of single-crystalline barium titanate thin films on silicon substrates, with Pockels coefficients of rEff ~ 148 pm/V. We further show the implementation of such layers into silicon photonic devices such as ring resonators.

© 2013 Optical Society of America

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription