Abstract

Faulty fringes coming from an infrared spectrometer may creep into a spectrum. Because these come from one faulty interferogram out of many used to obtain the spectrum, these may pass unnoticed. However, they cause some problems in the data treatment of factor analysis and other spectral analysis. We present a method for detecting the faulty fringes and give a simple method to eliminate them at the interferogram accumulation level.

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Appl. Opt. 58(13) 3393-3400 (2019)

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