Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 45,
  • Issue 6,
  • pp. 993-998
  • (1991)

Determination of the Wavelength Positioning Accuracy of a Sequential Scanning ICP Spectrometer

Not Accessible

Your library or personal account may give you access

Abstract

This work evaluates the wavelength reproducibility and accuracy of a sequential scanning plasma emission system. The long-term thermal and thermomechanical errors are found to be in the range of a few picometers. The short-term instability and mechanical instability are found to contribute very little error to wavelength positioning. The wavelength calibration algorithm is described. Its use improves the accuracy by a factor of 5 to 10 by comparison with results from the use of the diffraction grating equation alone.

PDF Article
More Like This
Investigation of the wavelength accuracy of Brewer spectrophotometers

Julian Gröbner, David I. Wardle, C. Thomas McElroy, and James B. Kerr
Appl. Opt. 37(36) 8352-8360 (1998)

Comparison study of algorithms and accuracy in the wavelength scanning interferometry

Hussam Muhamedsalih, Feng Gao, and Xiangqian Jiang
Appl. Opt. 51(36) 8854-8862 (2012)

Sequential Encoding with Multislit Spectrometers

John A. Decker and Martin O. Harwitt
Appl. Opt. 7(11) 2205-2209 (1968)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.