Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 42,
  • Issue 6,
  • pp. 1125-1127
  • (1988)

Determination of the Variation in the Water Content Across the Wall of a Fused-Silica Crucible by Transmission Fourier Transform Infrared Spectroscopy

Not Accessible

Your library or personal account may give you access

Abstract

One of the uses of fused-silica crucibles is to contain the silicon melt from which semiconductor crystals are grown by the Czochralski method. For three reasons, it is essential that the water content of the crucibles below. First, the softening temperature of the silica is a direct function of the water content. A low water content is necessary to maintain strength and geometry at the high temperatures used in semiconductor crystal growth. Second, water must not cause the contamination of semiconductor crystals. Third, the rate of devitrification is increased by water content. The water content of the crucibles is expected to be uniform, not varying from the inner wall to outer wall. Information on the variation of the water content of fused-silica crucibles is unavailable in the literature. However, transmission infrared spectroscopy has been used to determine water content in fused silica by correlation of the weight loss on heating with the decrease in the absorbance of the Si-OH band at 3680 cm<sup>−1</sup>. The weight loss is a consequence of the condensation reaction: 2 Si-OH → Si-O-Si + H<sub>2</sub>O (1)

PDF Article
More Like This
Polarization-dependent interference effects in grazing-angle Fourier transform infrared reflection–absorption spectroscopy to determine the thickness of water-ice films

Marin S. Robinson, Govind Mallick, Jennifer L. Spillman, Priscilla A. Carreon, and Stephanie Shalloo
Appl. Opt. 38(1) 91-95 (1999)

Transmittance and reflectance of crystalline quartz and high- and low-water content fused silica from 2 μm to 1 mm

James B. Heaney, K. P. Stewart, and Georg Hass
Appl. Opt. 22(24) 4069-4072 (1983)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved