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Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 40,
  • Issue 7,
  • pp. 944-948
  • (1986)

Detection of Spectral Overlap Interference in ICP-AES with an Empirical Linewidth Ratio Technique

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Abstract

ICP-AES line intensity data were fitted to a minimum-curvature smooth curve generated with the aid of a cubic semispline algorithm. These spline-fitted curves were used to obtain linewidth ratios which can provide accurate indication of spectral overlap with the use of only sample and standard spectra.

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