Abstract

The porosity of zirconia films prepared by plasma ion assisted deposition has been investigated by means of optical (spectrophotometric) and nonoptical analytic techniques such as transmission electron microscopy, x-ray reflection, and energy dispersive x-ray spectroscopy. A discrimination between large (open) and small (closed) pores was achieved by means of measurement of the thermal and vacuum-to-air shift. Depending on the level of plasma assistance during film preparation, the porosity was found to vary between 30 vol. % and nearly 0 vol. %. With decreasing porosity, the surface roughness determined by atomic force microscopy tends to decrease as well.

© 2017 Optical Society of America

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