Comparative analysis of the modified enclosed energy metric for self-focusing holograms from digital lensless holographic microscopy

Carlos Trujillo; Jorge Garcia-Sucerquia

doi:10.1364/AO.54.005102

Applied Optics
Vol. 54,
Issue 16,
pp. 5102-5108
(2015)
•https://doi.org/10.1364/AO.54.005102

Comparative analysis of the modified enclosed energy metric for self-focusing holograms from digital lensless holographic microscopy

Carlos Trujillo and Jorge Garcia-Sucerquia

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Carlos Trujillo and Jorge Garcia-Sucerquia, "Comparative analysis of the modified enclosed energy metric for self-focusing holograms from digital lensless holographic microscopy," Appl. Opt. 54, 5102-5108 (2015)

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Abstract

A comparative analysis of the performance of the modified enclosed energy (MEE) method for self-focusing holograms recorded with digital lensless holographic microscopy is presented. Notwithstanding the MEE analysis previously published, no extended analysis of its performance has been reported. We have tested the MEE in terms of the minimum axial distance allowed between the set of reconstructed holograms to search for the focal plane and the elapsed time to obtain the focused image. These parameters have been compared with those for some of the already reported methods in the literature. The MEE achieves better results in terms of self-focusing quality but at a higher computational cost. Despite its longer processing time, the method remains within a time frame to be technologically attractive. Modeled and experimental holograms have been utilized in this work to perform the comparative study.

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Equations (9)

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Metric	Computational Complexity
Dubois	$O (N \times N)$
Power spectrum	$O (N \times N + \ln N)$
Variance	$O (2 N \times N)$
Tamura	$O (2 N \times N)$
Gradient	$O (4 N \times N)$
Laplacian	$O (4 N \times N)$
MEE	$O (\sum_{i = 1}^{Δ x} i^{2} + N \times N)$

Metric	Number of Reconstructed Planes	Processing Time (s)
Dubois	100	1.1
Power spectrum	100	1.2
Variance	100	1.1
Tamura	100	1.1
Gradient	100	1.3
Laplacian	100	1.3
MEE	100	8.1

Metric	Computational Complexity
Dubois	$O (N \times N)$
Power spectrum	$O (N \times N + \ln N)$
Variance	$O (2 N \times N)$
Tamura	$O (2 N \times N)$
Gradient	$O (4 N \times N)$
Laplacian	$O (4 N \times N)$
MEE	$O (\sum_{i = 1}^{Δ x} i^{2} + N \times N)$

Metric	Number of Reconstructed Planes	Processing Time (s)
Dubois	100	1.1
Power spectrum	100	1.2
Variance	100	1.1
Tamura	100	1.1
Gradient	100	1.3
Laplacian	100	1.3
MEE	100	8.1

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Tables (2)

Equations (9)

Applied Optics