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Spatial Fourier spectroscopy of guided modes in low-dimensional structures

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Abstract

A new methodology for the study of low-dimensional thin-film structures and a new technique to determine nanolayer thickness are considered. These are based on recording and processing the changes in an angular Fourier spectrum of a light beam reflected from a prism coupler to excite the guided mode in a thin-film structure when the incident light beam intensity is increased.

© 2002 Optical Society of America

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