Abstract

An external-reflection scanning near-field optical microscope with the detected light polarized perpendicular to the polarization of the light coupled into the fiber is presented. When various metallic gratings are scanned, it is shown that the lateral and the depth resolutions of this microscope are better than 100 and 10 nm, respectively.

© 1994 Optical Society of America

Correlation between optical and topographical images from an external reflection near-field microscope with shear force feedback

Sergey I. Bozhevolnyi, Igor I. Smolyaninov, and Ole Keller
Appl. Opt. 34(19) 3793-3799 (1995)

Extension of the macroscopic model for reflection near-field microscopy: regularization and image formation

S. Bozhevolnyi, S. Berntsen, and E. Bozhevolnaya
J. Opt. Soc. Am. A 11(2) 609-617 (1994)

Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip

R. Bachelot, P. Gleyzes, and A. C. Boccara
Appl. Opt. 36(10) 2160-2170 (1997)

Polarization-resolved imaging with a reflection near-field optical microscope

Sergey I. Bozhevolnyi, Mufei Xiao, and Jørn M. Hvam
J. Opt. Soc. Am. A 16(11) 2649-2657 (1999)

Compact stand-alone near-field optical microscope combined with force detection

Fadi Issam Baida, Daniel Courjon, and Hartmut Bielefeldt
Appl. Opt. 37(10) 1808-1813 (1998)