Abstract

Instead of scanning the photoconductivity spectra continuously, a special computer-controlled experimental setup has been designed that enables step by step scanning and allows the photoresponse to be measured for a desired amount of time at each wavelength. With the help of this technique, it is possible to detect the contribution from the slow component of photoconductivity. This helps to resolve the finer details of the spectrum. Photoconductivity spectra of ternary compound ZnSiP₂ and commercially available CdSe:Cu were obtained using this technique. The results reveal structural details not reported before.

© 1987 Optical Society of America

Scanning ellipsometer by rotating polarizer and analyzer

L. Y. Chen and David W. Lynch
Appl. Opt. 26(24) 5221-5228 (1987)

Comparisons of vacuum surface effects on commercial photodiodes: spatial response uniformity via a computerized laser scanning system

Shlomo Hava
Appl. Opt. 26(1) 121-126 (1987)

Optical quenching of photoconductivity in CdSe single nanowires via waveguiding excitation

Fuxing Gu, Pan Wang, Huakang Yu, Bing Guo, and Limin Tong
Opt. Express 19(11) 10880-10885 (2011)

Stressed photoconductive detector for far-infrared space applications

J.-Q. Wang, P. L. Richards, J. W. Beeman, and E. E. Häller
Appl. Opt. 26(22) 4767-4771 (1987)

Considerations in building a low-noise reflection absorption infrared spectrometer

Jay B. Benziger, Richard E. Preston, and Gregory R. Schoofs
Appl. Opt. 26(2) 343-350 (1987)