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Line-profile measurement of xerographic copy

F. R. Ruckdeschel and C. H. Stephan

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Abstract

An algorithm is presented which permits easy and rapid characterization of lines typically observed in xerographic copy. The outputs of the algorithm are line edge width, line width, and peak density. Auxiliary outputs are line darkness and spatial frequency content. Data are presented which compare two major xerographic products with lithography and other reproduction processes.

© 1978 Optical Society of America

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