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Thickness dependent electron-lattice equilibration in thin Bi films studied by time-resolved MeV electron diffraction

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Abstract

Using time-resolved electron diffraction the electron-lattice equilibration in laser-excited thin Bi-films has been investigated. Our data reveal a pronounced thickness-dependence which is attributed to cross-interfacial coupling of hot electrons in the Bi-film to substrate phonons.

© 2016 Optical Society of America

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