Abstract

Propagating strain waves in SrTiO<sub>3</sub> launched from PbZr<sub>0.2</sub>Ti<sub>0.8</sub>O<sub>3</sub> films are measured by time-resolved x-ray diffraction. X-ray interference among contributions from differently strained regions allow to determine absolute transient strain amplitudes down to Δa(t)/a<sub>0</sub> ≈ 2 · 10<sup>-5</sup>.

© 2006 Optical Society of America

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