Abstract

Propagating strain waves in SrTiO3 launched from PbZr0.2Ti0.8O3 films are measured by time-resolved x-ray diffraction. X-ray interference among contributions from differently strained regions allow to determine absolute transient strain amplitudes down to ∆a(t) / a0 ≈ 2 10-5

© 2006 Optical Society of America

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