Abstract

T-ray computed tomography (T-ray CT) is an important new tomographic imaging modality utilizing ultrafast laser sources to probe the optical properties of 3 dimensional (3D) structures in the far-infrared [1]. It promises to have important applications in non-destructive mail and packaging inspection, semiconductor testing and manufacturing quality control. It provides sectional images of objects in an analogous manner to conventional computed tomography techniques such as X-ray CT.

© 2002 Optical Society of America

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