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Picosecond time-resolved X-ray diffraction from a silicon crystal under laser-induced breakdown

K.G. Nakamura, Y. Hironaka, A. Yazaki, F. Saito, and K. Kondo

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Abstract

Picosecond time-resolved x-ray diffraction is performed for a Si(lll) under laser- induced breakdown using picosecond pulsed X-rays. Transient change in strain profiles due to the shock compression generated by laser-induced breakdown is observed.

© 2000 Optical Society of America

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