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Conferences > UEO > 1997 > UF > UF10

A Reliable Method for the Extraction of Material Parameters of Thick and Thin Samples in THz Time-Domain Spectroscopy

Lionel Duvillaret, Frédéric Garet, Jean-Louis Coutaz, and John F. Whitaker

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Abstract

We present a fast and reliable method for extracting the refractive index and absorption in terahertz time-domain spectroscopy and apply it to the characterization of various thin films.

© 1997 Optical Society of America

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