Abstract

We succeeded for the first time in visualizing instantaneous voltage distribution of 2ps electrical pulse propagating on coplanar strips (CPS). This result was obtained using a scanning force optoelectronic microscope (SFOEM) which we have developed by coupling a scanning force microscope (SFM) and an ultrafast optical sampling technique. The observed voltage distribution shows a single peak deviating outward. the experimental results prove possibility of the SFOEM in measuring ultrafast and ultra-dense electronic devices.

© 1997 Optical Society of America