Abstract

An experimental study of the electric near-field distribution of two different types of planar transmitters for the 76.5 GHz frequency regime important for automotive applications is presented. Three-dimensional field mapping is performed with a novel stroboscopic optoelectronic technique combining electrooptic testing (near-field measurements) with photoconductive probing (far-field). The detected mode patterns give a detailed insight into the operation of the devices under test and allow tracing back mode anomalies to misdesigned parts of the structure for improved and direct failure analysis.

© 1997 Optical Society of America