Abstract

Recently, several optoelectronic phase lock schemes have been demonstrated to meet the demand of synchronizing the target voltage-controlled-oscillator to the harmonics of optical probing pulses [1-4]. In reality, the microwave signal under test might be free-running and originated from a monolithic microwave integrated circuit (MMIC). In this work, we demonstrate optoelectronic phase tracking and electro-optic sampling of the microwave signal from a free-running oscillator. Gain-switched semiconductor lasers are employed. This system has potential applications for on-wafer testing of MMIC’s.

© 1995 Optical Society of America