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High-Frequency On-Wafer Testing with Freely Positionable Silicon-on-Sapphire Photoconductive Probes

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Abstract

Electronic and optoelectronic devices have become available with cut-off frequencies up to severa1 hundreds of GHz. This technological push necessitates the development of new measurement techniques, because conventional electronic measurement equipment such as network analyzers or sampling oscilloscopes are limited in bandwidth to 40 - 100 GHz.

© 1995 Optical Society of America

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