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Highly Reproducible Optoelectronic Wafer Probes with Fiber Input

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Abstract

We have constructed optoelectronic wafer probes with fiber pigtails and demonstrated accurate, reproducible measurements of the complex reflection coefficient Sll at frequencies up to 125 GHz. Vector accuracy enhancement routines, based on the measurement of known standard devices, are used to remove the effects of tip reflections and other systematic errors. Groundbridging straps are shown to suppress the mode conversion errors which result from asymmetric excitation of the coplanar waveguide probe.

© 1993 Optical Society of America

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