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Conferences > SOF > 2020 > SoTh1H > SoTh1H.6
  • OSA Advanced Photonics Congress (AP) 2020 (IPR, NP, NOMA, Networks, PVLED, PSC, SPPCom, SOF)
  • OSA Technical Digest (Optica Publishing Group, 2020),
  • paper SoTh1H.6
  • •https://doi.org/10.1364/SOF.2020.SoTh1H.6

Highly resolved interferometric measurement of refractive index difference between two silica-based materials

Baptiste Leconte, Romain Dauliat, Marie-Alicia Malleville, Raphaël Jamier, Sébastien Tanzilli, Laurent Labonté, Anka Schwuchow, Katrin Wondraczek, and Philippe Roy

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Abstract

A new method has permitted the measurement of the refractive index difference between two silica-based materials with an unprecedented accuracy of ±1.10-5 thanks to a novel fiber design associated with a classic Mach-Zehnder interferometer.

© 2020 The Author(s)

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