THz Beam Sensors

J. A. Riordan; P.Y. Han; Zhiping Jiang; P. Campbell; Z.G. Lu; Z.G. Lu; X.-C. Zhang

doi:10.1364/RPDS.1998.RTuD3

Radiative Processes and Dephasing in Semiconductors
OSA Trends in Optics and Photonics Series (Optica Publishing Group, 1998),
paper RTuD3
•https://doi.org/10.1364/RPDS.1998.RTuD3

THz Beam Sensors

J. A. Riordan, P.Y. Han, Zhiping Jiang, P. Campbell, Z.G. Lu, and X.-C. Zhang

Radiative Processes and Dephasing in Semiconductors 1998

Coeur d' Alene, Idaho United States
ISBN: 1-55752-525-0

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Infrared II (RTuD)

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J. A. Riordan, P. Y. Han, Z. Jiang, P. Campbell, Z. G. Lu, and X. -. Zhang, "THz Beam Sensors," in Radiative Processes and Dephasing in Semiconductors, D. Citrin, ed., Vol. 18 of OSA Trends in Optics and Photonics Series (Optica Publishing Group, 1998), paper RTuD3.

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Abstract

We report the use of electro-optic crystals for THz beam detection. The electro-optic measurement with a chirped optical pulse allows us to capture a THz pulse with an unprecedented data acquisition rate. We use electro-optic crystals to generate and detect broadband mid-infrared THz pulses. We present the results of real-time, 2-D THz wave imaging. We also show the preliminary results of free-space magneto-optic sampling.

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