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Nanoscopic single particle microscopy with a deterministic single ion source

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Abstract

We realize a single particle microscope by using deterministically extracted laser cooled ions from a Paul trap as probe particles for transmission imaging. We demonstrate focusing of the ions to a 1-σ-radius of 5.8 ± 1.0 nm and a minimum two-sample deviation of the beam position of 1.5 nm in the focal plane [1]. The deterministic source gives rise to much higher signal-to-noise ratios as compared with Poissonian sources. Gating of the detector signal by the extraction event suppresses dark counts by 6 orders of magnitude. We implement a Bayes experimental design approach to microscopy in order to maximize the gain in spatial information. Future applications of the single ion source are the deterministic doping [2] of diamond or silicon samples at the nm-scale to fabricate quantum devices [3]. Recently, we have observed NV centers forming from implanted N2+ molecular ions. I will discuss also future developments such as the new modular setup for improvements of the spot size to less than 1nm, or the loading of other doping ions like Presodym, Cer or Phosphorus.

© 2017 Optical Society of America

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