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Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri, Anthony J. Hoffman, Matthew Escarra, Claire F. Gmachl, and Viktor A. Podolskiy

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Abstract

We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

© 2010 Optical Society of America

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