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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2006),
  • paper JWB6

Relative Intensity Noise Characteristics in a Frequency Stabilized Modelocked Semiconductor Laser System

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Abstract

RIN characteristics in a frequency stabilized MSL were experimentally and theoretically investigated. Average RIN level of less than -150dB/Hz as well as Modal RIN reduction of approximately 3dB were obtained from the frequency stabilized MSL.

© 2006 Optical Society of America

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