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Conferences > QELS > 2005 > QFC > QFC4
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2005),
  • paper QFC4

Time-Resolved X-Ray Absorption Fine Structure Measurement of Laser-Melted Si with Femtosecond Laser-Produced-Plasma X-Ray Source

Katsuya Oguri, Yasuaki Okano, Tadashi Nishikawa, and Hidetoshi Nakano

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Abstract

We describe the picosecond time-resolved measurement of the x-ray absorption fine structure in laser-melted Si by using a femtosecond laser-produced-plasma soft x-ray source and report that the Si-Si atomic distance broadened due to the melting.

© 2005 Optical Society of America

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