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Optica Publishing Group
  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 2001),
  • paper QWA18

Single-beam second-harmonic spectroscopic interferometry of buried interfaces of Column IV semiconductors

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Abstract

The single-beam second-harmonic (SH) spectroscopic interferometry (SHSI) is proposed as a combined spectroscopic nonlinear optical technique which allows to measure simultaneously the spectra of the phase and amplitude of the SH radiation from the buried semiconductor interfaces.

© 2001 Optical Society of America

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