Evaluation of near-field optical potentials on a nanometric sharpened fiber probe for atom trapping

Kouki Totsuka; Hideaki Tanioka; Hideaki Tanioka; Haruhiko Ito; Haruhiko Ito; Motoichi Ohtsu; Motoichi Ohtsu

Quantum Electronics and Laser Science Conference
OSA Technical Digest (Optica Publishing Group, 2000),
paper QMF5

Evaluation of near-field optical potentials on a nanometric sharpened fiber probe for atom trapping

Kouki Totsuka, Hideaki Tanioka, Haruhiko Ito, and Motoichi Ohtsu

Quantum Electronics and Laser Science Conference 2000

San Francisco, California United States
7–11 May 2000
ISBN: 1-55752-608-7

From the session
Near-Field Optics (QMF)

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K. Totsuka, H. Tanioka, H. Ito, and M. Ohtsu, "Evaluation of near-field optical potentials on a nanometric sharpened fiber probe for atom trapping," in Quantum Electronics and Laser Science Conference, T. Gallagher, H. Van Driel, H. Gibbs, and D. Wineland, eds., OSA Technical Digest (Optica Publishing Group, 2000), paper QMF5.

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Abstract

Recently, atom manipulation by using optical near fields has been attracting a lot of interests.

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