Abstract

Semiconductor microcavity lasers such as vertical-cavity surface-emitting lasers (VCSELs) are well suited for a number of important optoelectronics technologies such as data communication, optical data storage, laser printing, and optical computing. Many of these technologies require high efficiency and ultralow threshold semiconductor lasers with well-understood threshold properties. In this paper, we describe a study of the underlying physical mechanisms governing the threshold properties of a VCSEL. In particular, We evaluate the mechanisms that effect the threshold properties as a function of emission wavelength. Other important issues, such as the dependence of the threshold properties on microcavity dimensions, will be discussed.

© 1996 Optical Society of America