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Conferences > QELS > 1995 > QThG > QThG43
  • Quantum Electronics and Laser Science Conference
  • OSA Technical Digest (Optica Publishing Group, 1995),
  • paper QThG43

Josephson plasma resonance in YBa2Cu3O7–8 with intrinsic weak links

Ch. Jaekel, G. Kyas, H. G. Roskos, H. Kurz, W. Prusseit, and H. Kinder

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Abstract

The growth of high-Tc. superconductors on silicon wafers is generally hampered by the existence of a critical thickness dc. at which microcracks appear within the film. The critical thickness dc. for YBa2Cu3O7 on YSZ (yttria-stabilized zirconia) on silicon is known to be about 50-70 nm. Recent experimental results suggest that the density of microcracks or weak links increases rapidly at thicknesses well below the established value of the critical thickness.1

© 1995 Optical Society of America

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