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Conferences > Photonics > 2016 > P1A > P1A.15

Characterization of Sapphire (α-Al2O3) Thin Film Fabricated By Pulsed Laser Deposition

Sasmita Behera and Alika Khare

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Abstract

Good quality c-axis oriented Sapphire thin film was grown by Pulsed Laser Deposition technique. The film was subjected to Raman and UV-visible spectrometer for its characterization.

© 2016 Optical Society of America

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