Abstract
We describe a non-destructive optical technique to probe semiconductor surfaces, using ultrafast pump-probe transient absorption spectroscopy (TAS). Angle-dependent TAS decouples surface and bulk differential absorptions to measure surface dynamics.
© 2019 The Author(s)
PDF ArticleMore Like This
Xinhai Zhang, Mingjie Li, Bo Wu, Sandy Adhitia Ekahana, Muhammad Iqbal Bakti Utama, Guichuan Xing, Qihua Xiong, and Tze Chien Sum
AF2A.7 Asia Communications and Photonics Conference (ACP) 2013
Fabian Schlaepfer, Matteo Lucchini, Shunsuke A. Sato, Mikhail Volkov, Lamia Kasmi, Nadja Hartmann, Angel Rubio, Lukas Gallmann, and Ursula Keller
cg_4_4 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2019
N. Furukawa, J. Takeda, C. E. Mair, and V. D. Kleiman
ME54 International Conference on Ultrafast Phenomena (UP) 2004