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Angle-Dependent Pump-Probe Differential Transient Absorption Spectroscopy as a Novel Technique to Examine Surface Properties of Semiconductor Nanostructures

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Abstract

We describe a non-destructive optical technique to probe semiconductor surfaces, using ultrafast pump-probe transient absorption spectroscopy (TAS). Angle-dependent TAS decouples surface and bulk differential absorptions to measure surface dynamics.

© 2019 The Author(s)

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