Abstract
This study demonstrates mechanical-induced changes in plasmonic responses at internanoparticle gaps in assembled films of oxide semiconductor nanoparticles. Tensile and compressive stress provides differences in reflection intensities and peak shifts, which clearly reflected the origins of plasmon excitations. These results should lead to non-invasive self-diagnosis on a structure based on strain viewing in the infrared range.
© 2017 Optical Society of Japan
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