Indices of refraction for very thin layers (<30 nm) change widely with the layer thickness, the bounding materials, and the processes used to produce the films. The tools to design with these layers are described.

© 2019 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription