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Conferences > OIC > 2013 > ThC > ThC.9

Spatially-resolved surface topography retrieved from far-field intensity scattering measurements

M. Zerrad, M. Lequime, S. Liukaityte, and C. Amra

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Abstract

A far field set-up based on the fast and simultaneous recording of 1 million intensity ARS patterns allows both to reconstruct surface topography, and to cancel local defects in this topography.

© 2013 Optical Society of America

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