Ellipsometric Modeling of Ultrathin Silver-Silica Heterostructures

D. Zola; M. Giambra; M. L. Grilli; M. Fang; A. Sytchkova

doi:10.1364/OIC.2013.TA.7

Optical Interference Coatings
OSA Technical Digest (online) (Optica Publishing Group, 2013),
paper TA.7
•https://doi.org/10.1364/OIC.2013.TA.7

Ellipsometric Modeling of Ultrathin Silver-Silica Heterostructures

D. Zola, M. Giambra, M. L. Grilli, M. Fang, and A. Sytchkova

Optical Interference Coatings 2013

Whistler Canada
16–21 June 2013
ISBN: 978-1-55752-970-1

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Photonic Stuctures (TA)

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D. Zola, M. Giambra, M. L. Grilli, M. Fang, and A. Sytchkova, "Ellipsometric Modeling of Ultrathin Silver-Silica Heterostructures," in Optical Interference Coatings, M. Tilsch and D. Ristau, eds., OSA Technical Digest (online) (Optica Publishing Group, 2013), paper TA.7.

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Abstract

R. F. sputtered ultrathin silver-silica heterostructures were studied by variable-angle spectroscopic ellipsometry and by its analogue working in total reflection mode. The last one enables an enhanced sensitivity to the interface plasmonic properties.

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