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Zr/Mg multilayer mirror for extreme ultraviolet application

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Abstract

A novel Zr/Mg multilayer mirror for extreme ultraviolet (EUV) spectral range was proposed and deposited by magnetron sputtering. The near-normal-incidence reflectance of Zr/Mg multilayer is 30.6% at He emission line (λ=30.4 nm). The reflectance slightly decreases with annealing temperature when not above 500°C and eventually drops to 15.1% at 600°C. Zr/Mg is a promising multilayer for EUV applications for its high reflectivity and thermal stability.

© 2013 Optical Society of America

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