Abstract
Silver nanorod arrays with the thicknesses of 200±5 nm and 300±5 nm are deposited using glancing angle deposition (GLAD) technique. The transmission and the reflection coefficients of silver films for p- and s-polarized lights are measured at the wavelength of 639 nm by walk-off and polarization interferometers. Due to the magnetic effect, the films would exhibit different negative real parts of the equivalent refractive indices with different thicknesses.
© 2010 Optical Society of America
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